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International Journal of PIXE (IJPIXE)
International Journal of PIXE is a quarterly journal covering the latest developments in the various aspects of particle-induced X-ray emission (PIXE), including the fundamentals of this process, its applications and the techniques employed in different kinds of applications. It seeks to enhance communication between basic and applied scientists by compiling relevant research papers and review articles which would otherwise be widely dispersed in a number of specialized journals that cover PIXE only as one of the related subjects. The scope of the journal encompasses the following:
  • Fundamental Aspects
    Ion-atom, electron-atom and photon-atom collisions; ionization; X-ray and Auger electron production; solid state effect; excitation-assisted chemical reactions.
  • Techniques
    Microbeam and external-beam techniques; data handling; RBS; synchrotron radiation; sample preparation.
  • Applications
    Biomedical, pharmaceutical, biological, archaeological, geological, environmental, high-technological and industrial applications.

Abstracting/Indexing

  • CSA Pollution Abstracts
 

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